First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Researchers at Oak Ridge National Laboratory have used specialized tools to study materials at the atomic scale and analyze ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

The study of biological systems varies from whole organisms, organs, and organoids, down to their building blocks of proteins and cells. At the lower end of the scale, atomic force microscope (AFM) ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...