EurekAlert!

Label attention meets deep learning: a novel model for ICD-11 automatic classification of Chinese EMRs

BiLSTM, an ICD-11 automatic coding model using MC-BERT and label attention. Experiments on clinical records show 83.86% ...
EurekAlert!

Empirically revisiting and enhancing automatic classification of bug and non-bug issues

A large body of research effort has been dedicated to automated issue classification for Issue Tracking Systems (ITSs). Although the existing approaches have shown promising performance, the different ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
EDN

Electroglas adds auto defect classification to wafer inspection

SAN JOSE, Calif. – Electroglas Inc., a supplier of process management tools for the semiconductor industry, has introduced automatic defect classification software that it calls DefectID. DefectID ...