New manufacturing test challenges are raised with SoC technology advances where both test quality and test costs are affected with a direct impact on current Design-For-Test (DFT) methodologies and ...

Semiconductor companies are racing to develop AI-specific chips to meet the rapidly growing compute requirements for artificial intelligence (AI) systems. AI chips from companies like Graphcore and ...

What if all the DFT verification on your next big chip could be completed before tape-out? This “shift-left” of DFT verification would eliminate the need for shortcuts in verification and allow for ...

Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...

Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...

Low cost, design-for-test (DFT) ATE continues to make inroads into device testing. Sharp Electronics Corp's U.S. subsidiary was able to cut the time it spent validating scan vectors from a week and a ...