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Joint research validates new semiconductor etching process, achieving five times speed improvement
A collaborative research team from Nagoya University and Tokyo Electron Miyagi Ltd. has demonstrated that the company's new ...
Scanning electron microscopy (SEM) is an advanced analytical tool that massively outstrips the capabilities of traditional light microscopy. Using visible wavelengths of light on the 400 – 700 ...
Researchers at the University of Sheffield have created what sounds impossible - even nonsensical: an experimental electron microscope without lenses that not only works, but is orders of magnitude ...
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