Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...
Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
Driven by the expansion of wireless and power-efficient devices and by the marketing requirement to deliver 'green' electronic systems, designers are increasingly employing low power design techniques ...
Development teams that benefit most from high-resolution additive manufacturing are using it to ask better questions earlier ...
Two companies have joined forces to optimize quality, integrity, post-programming validation, and cost for embedded test of reprogrammable logic cores. The increasing complexity of system-on-a-chip ...
November 23, 2012. Aeroflex Ltd. announced that it now offers its 5800 Series multi-functional test system with a Virginia Panel interface, an industry-standard interface used by test fixture ...
Palo Alto, Calif.—Test-and-measurement vendor Agilent Technologies, Inc. now offers a cost-effective mobile-phone functional tester. Agilent's GS-8210 system includes a mobile test station and test ...
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