EDN

RF device reliability testing takes center stage

http://www.maxwell.comSystem reliability concerns are imperative to the implementation of today's broadband wireless infrastructure. Wireless networks require new ...
Electronic Design

Evolutionary Changes for RF Device Testing

With the demand for more functionality at less cost, the RF testing landscape is evolving and morphing into a new frontier. In the cellular space, convergence of services continues to occur at an ...
EDN

A brief introduction of RF test chambers and ranges

It is often necessary to provide some type of shielding in order to perform RF/wireless testing with an acceptable amount of external noise. It is also often necessary to perform testing where the ...
Electronic Design

Next-Generation RF Device Test Performance Challenges

This is the second article of a three-part series discussing the likely impacts of next-generation consumer wireless semiconductor devices on instrumentation performance requirements. The first ...
Semiconductor Engineering

Meeting The Challenges Of 5G RF Production Test Services

Implementation of the 5G radio frequency (RF) standard is increasing rapidly [1]. Over the past four to six quarters, there has been an increased focus on publications and products that have been ...
Semiconductor Engineering

Hybrid System-Level Test For RF SiP

The IoT represents a rapidly growing market for which high-speed wireless connections suitable for various usage systems are indispensable. The arrival of digital transportation is accelerating this ...
The Fast Mode

Semtech, Anritsu Collaborate on Ultra-High-Speed Optical Device Testing for AI & Data Centers

Anritsu Company and Semtech are announcing a joint demonstration at OFC 2026, highlighting an advanced high speed characterization solution for next generation optical interconnects. Demonstrations ...
Business Wire

NI Announces FiRa-Validated Automated Test Tool for UWB PHY Layer Validation and Conformance Testing

AUSTIN, Texas--(BUSINESS WIRE)--NI (NASDAQ: NATI), a trusted global leader in Semiconductor Test & Measurement, today announced validation by the FiRa TM Consortium of its UWB PHY test solution. NI’s ...
RFID Journal

IoT and Other RF Device Suppliers Take Note: The FCC’s New Authorization and Importation Rules Are Now Effective

The CommLaw Group‘s Ronald Quirk has issued the following advisory: The Federal Communications Commission’s (FCC) new rules for radio frequency (RF) equipment authorization are, as of today, ...
Digi Times

STAr Technologies announces sale of Accel-RF HTOL Burn-In systems to top Taiwan semiconductor foundries

STAr Technologies, a leading supplier of semiconductor reliability test systems, today announces the sale of Accel-RF HTOL Burn-In test systems to top semiconductor foundries in Taiwan. Accel-RF ...
Machine Design

FCC Equipment Authorizations: Guidelines for Equipment and IoT Devices

A big step in bringing electronic devices to market is going through Federal Communications Commission (FCC) testing and gaining equipment authorization. A device that receives equipment authorization ...