Efficiently identify and map tire fillers with streamlined material analysis—explore the details in this application note.

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

Locard’s exchange principle, which states that “every contact leaves a trace” drives the concept of “trace evidence” in the forensic sciences. Trace evidence is usually classed as fine particles, ...

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...

Lithium-ion batteries are a form of rechargeable energy storage with high energy density. They have become vital to portable electronic devices, including cell phones, computers, construction power ...

Continued scaling of integrated circuits to smaller dimensions is still a viable way to increase compute power, achieve higher memory cell density, or reduce power consumption. These days, chip makers ...