The size of designs continues to grow and IC manufacturers are pushing for higher test quality, especially in mission-critical applications such as transportation and medicine. More advanced nodes ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...

A convergence of DFT techniques and the proliferation of in-silicon monitors can flag potential failures before they occur.

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

Until the mid-1970s, compression testing of composite materials received relatively little attention. Up to that point it, had generally been assumed that the compressive stiffness was approximately ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...