The huge number of ICs used in today’s electronic products is difficult to comprehend, and each one has to be tested. Traditionally, testing starts at the wafer level to determine gross defects. By ...

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...

This file type includes high resolution graphics and schematics when applicable. Selecting the right probe for your application is the first step toward making reliable oscilloscope measurements.

A selection of probes, from [Jim Williams’] Linear Technology app note 72. It’s not often that we are shown an entirely new class of test equipment here at Hackaday, so it was with some surprise that ...