The U.S.-based metrology equipment manufacturer has launched a non-contact photoluminescent imaging system to reveal defects and other non-uniformities in silicon, thin film, and III-V multijunction ...
A new publication from Opto-Electronic Science; DOI 10.29026/oes.2023.230003 overviews multiwavelength high speed quantum well nanowire array micro-LED for next-generation on-chip optical ...
ATLANTA--(BUSINESS WIRE)--Samsung LED (CEO, Jaekwon Kim) announced on September 20 th that its mid-power 2323 LED package has now exceeded 6,000 hours of independent, EPA recognized 3 rd party IES ...
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