Semiconductor Engineering

Wafer Probe Struggles To Adapt To Multi-Die Assemblies

Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.
Electronic Design

Probes test electronic devices under extreme conditions

Santa Rosa, CA. Keysight Technologies has introduced two extreme-temperature probing solutions: the N7007A extreme-temperature 400-MHz passive probe and the N7013A extreme-temperature extension kit ...
Electronic Design

Flying probes take on the challenge of loss of test access

Today’s electronic circuit-board technology is posing a big challenge to in-circuit test techniques because of the disappearance of access. As a result, a shift from bed-of-nail to flying-probe ...
Semiconductor Engineering

Testing Silicon Photonics In Production

As silicon photonics costs come down, the technology is being worked into new applications, from connectivity to AI. But full commercial production requires testing those photonic circuits before ...
Electronics Weekly

Tek’s isolated scope probes get smaller and better

Tektronix has announced a second-generation of IsoVu isolated oscilloscope probes, claiming smaller size, easier use and enhanced electrical performance. Isolated probes are for probing power systems ...